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Computer Integrated Documentation

April 2006

CID 3.00 - Move up to the next level in data recording

  • all of the important device data at a glance
  • all running tests are displayed, at the same time assisting efficient test planning
  • simple programming of test cycles
  • clear and precise evaluation of the test results
  • reporting of all events such as errors, switching functions and entries
  • comprehensive communications possibilities
  • special menus for temperature shock test chambers
  • communication between chambers via RS232, RS485 or network
  • online monitoring functions for other computers in a network
  • supported operating systems:
    Windows 98, NT 4.0, 2000, XP
  • acquisition and control of installation parameters via various digital and analogue interfaces
  • measurements on the specimen
  • central operation control and analysis for all installations