Computer Integrated Documentation

April 2006

CID 3.00 - Move up to the next level in data recording

• all of the important device data at a glance
• all running tests are displayed, at the same time assisting efficient test planning
• simple programming of test cycles
• clear and precise evaluation of the test results
• reporting of all events such as errors, switching functions and entries
• comprehensive communications possibilities
• special menus for temperature shock test chambers
• communication between chambers via RS232, RS485 or network
• online monitoring functions for other computers in a network
• supported operating systems:
  Windows 98, NT 4.0, 2000, XP
• acquisition and control of installation parameters via various digital and analogue interfaces
• measurements on the specimen
• central operation control and analysis for all installations